Invitation to the SENTECH Seminar: “Ellipsometry and Reflectometry for characterizing thin films”

SENTECH as a worldwide leader in thin film measurement and plasma process technology is glad to announce a one day seminar “Ellipsometry and Reflectometry for characterizing thin films”. The Seminar will take place on June 24th, 2014, at the NOVOTEL Hotel “München Messe” in Munich-Riem.

(firmenpresse) - This innovative application oriented seminar focuses on ellipsometry and reflectometry for thin film analysis. Contributions from experts of different research areas will cover the characterization of organic layers like OLED´s or organic solar cells. Furthermore the characterization of large surface materials and photovoltaics will be emphasized.

SENTECH experts will give presentations on our newly developed spectroscopic ellipsometers and SpectraRay software for thin film measurement. We will be glad to demonstrate our ellipsometers and reflectometers during the Seminar.

All presentations are available to the participants after the seminar.

Please use the registration form to register as soon as possible, it is available at our website.

The number of participants is limited to 30. Attendance fee: 180,00 € incl. VAT.

Please send your registration via mail or via fax to +49 89 897 9607-22. For further questions please contact SENTECH via telephone: +49 89 897 9607-0.

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Unternehmensinformation / Kurzprofil:
Bereitgestellt von Benutzer: SentechPia
Datum: 27.05.2014 - 11:59 Uhr
Sprache: Deutsch
News-ID 332132
Anzahl Zeichen: 1354

contact information:
Contact person: Pia Romanowski
Town:

Schwarzschildstr. 2, 12489 Berlin, Germany

Phone: +49 30 63 92 55 20

Kategorie:

Automotive

Typ of Press Release: bitte
type of sending: Veröffentlichung

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