Elmos Semiconductor AG: New Milestone for HALIOS(R)-IC Family achieved
(firmenpresse) - (DGAP-Media / 22.05.2013 / 10:30)
HALIOS(R)-IC enables a new level of functions and precision in Stud Finders
The introduction of a HALIOS(R)-IC in a Stud Finder marks a further
milestone for this Elmos-chip family. For the first time an IC using the
Elmos technology HALIOS(R) is showing its capabilities not only in an
optical sensor solution but also in a capacitive application. Based on the
unique Elmos technology the new Zircon(R) MultiScanner(TM) x85 OneStep(TM)
achieves high-performance detection of nearly all relevant materials in
walls, floors or ceilings. This is a proof for the precision, reliability
and variety of the Elmos HALIOS(R) technology.
The device integrates the Elmos-IC E909.05. Today many optical
applications, like rain/light sensor, Human Machine Interface solutions in
the new VW Golf VII and GM Cadillac models or gesture switches in lamp
applications, are already using HALIOS(R).
First of its kind, the Zircon MultiScanner x85 uses the Elmos HALIOS(R)
patented active and capacitive techniques during the calibration process to
minimize detection mistakes and toggles between thermal, AC, and stud modes
to additionally scan for live AC wiring and find wood and metal studs. With
a simple push of a button, the user is able to accurately scan and
digitally view the center of a target, up to two inches deep. By using the
x85 prior to drilling, cutting, or fastening, tool users can avoid
penetrating into hydronic radiant floor heating systems, saving thousands
of dollars in damage, expensive repairs, and idle construction work time.
Zircon's President, John Stauss, is excited about the new possibilities.
'Unprecedented in one tool, the x85 accurately locates long sought after
Pex tubing and also detects live, unshielded wiring and wood and metal
studs-solving a wide range of industrial, commercial, and DIY problems. The
x85 signifies one of the industry's largest technological advances ever
made,' states Stauss in the press release for the Zircon MultiScanner x85.
The E909.05 is based on the patented measurement principle which was up to
now used for superior optical sensors. It is the only principle in the
world that works with true physical compensation. In optical applications
it neutralizes parasitic physical effects (like ambient light) in the photo
diode. Additionally these sensors can be designed for extremely low current
consumption and unrivaled temperature stability. Used with other sensor
principles (e. g. capacitive) HALIOS(R) together with the thereby enabled
IC-mechanisms is the key to unseen performance. In the Zircon MultiScanner
x85 these outstanding capabilities are now used - for the first-time - with
non-optical detection principles.
The Zircon MultiScanner x85 will be available at many US building supply
stores.
Elmos Semiconductor AG is a developer and manufacturer of system solutions
on semiconductor basis. For more than 25 years, our chips have made
vehicles as well as industrial and consumer goods more performance and
power efficient.
Contact: Elmos Semiconductor AG, Janina Rosenbaum, Heinrich-Hertz-Str. 1,
44227 Dortmund, Phone: +49 231-7549-0, Extension: -287, Fax: +49
231-7549-548, invest(at)elmos.com, www.elmos.com
End of Media Release
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Issuer: ELMOS Semiconductor AG
Key word(s): Research/Technology
22.05.2013 Dissemination of a Press Release, transmitted by DGAP - a
company of EquityStory AG.
The issuer is solely responsible for the content of this announcement.
DGAP's Distribution Services include Regulatory Announcements,
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Media archive at www.dgap-medientreff.de and www.dgap.de
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Language: English
Company: ELMOS Semiconductor AG
Heinrich-Hertz-Str. 1
44227 Dortmund
Germany
Phone: +49 (0)231 7549-575
Fax: +49 (0)231 7549-548
E-mail: invest(at)elmos.com
Internet: http://www.elmos.com
ISIN: DE0005677108
WKN: 567710
Listed: Regulierter Markt in Frankfurt (Prime Standard);
Freiverkehr in Berlin, Düsseldorf, Hamburg, München,
Stuttgart
End of News DGAP-Media
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Datum: 22.05.2013 - 10:30 Uhr
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