SENTECH Seminar on Ellipsometry and Reflectometry for characterizing thin films 2015

SENTECH experts in thin film measurement kindly invite you to our annual seminar “Ellipsometry and Reflectometry for characterizing thin films”.

(firmenpresse) - Focus of this seminar will be on spectroscopic ellipsometry and reflectometry for the analysis of thin films. The contributions of external experts from research and industry, e.g. on cryo ellipsometry and on quality control of PERC cells will be particularly interesting.

SENTECH experts will give presentations on our recent developments. SENDURO® MEMS is the solution to automated process control in MEMS and sensor manufacturing. Furthermore there will be a presentation on in situ process optimization with the new ALD Real Time Monitor.

This application oriented event will take place at the Commundo-Tagungshotel Stuttgart/ University Campus of Stuttgart on June 18th, 2015. The talks will be given in German. After the contributions, you are kindly invited to a demonstration of SENTECH ellipsometers and reflectometers in the application lab. The agenda is to be downloaded at our website.

Please register for the seminar at sales(at)sentech.de using our registration form as soon as possible, as the number of participants is limited to 30. Attendance fee: 180,00 € incl. VAT.Hotel bookings in the Commundo Hotel are possible upon request. For further questions please contact SENTECH via telephone: +49 89 897 9607-0.

Weitere Infos zu dieser Pressemeldung:

Themen in dieser Pressemitteilung:


Unternehmensinformation / Kurzprofil:
Bereitgestellt von Benutzer: SentechPia
Datum: 18.05.2015 - 15:47 Uhr
Sprache: Deutsch
News-ID 393982
Anzahl Zeichen: 1424

contact information:
Contact person: Pia Romanowski
Town:

Berlin

Phone: +49 30 63 92 55 20

Kategorie:

Advertising, PR and Marketing

Typ of Press Release: Unternehmensinformation
type of sending: Veröffentlichung
Date of sending: 18.05.2015

Diese Pressemitteilung wurde bisher 681 mal aufgerufen.


Die Pressemitteilung mit dem Titel:
"SENTECH Seminar on Ellipsometry and Reflectometry for characterizing thin films 2015"
steht unter der journalistisch-redaktionellen Verantwortung von

SENTECH Instruments GmbH (Nachricht senden)

Beachten Sie bitte die weiteren Informationen zum Haftungsauschluß (gemäß TMG - TeleMedianGesetz) und dem Datenschutz (gemäß der DSGVO).

SENTECH Invitation to Plasma Process Technology Seminar ...

SENTECH offers an application oriented seminar “Plasma Process Technology” on March 28, 2019 at SENTECH in Berlin-Adlershof. We are glad to announce that invited speakers from industry and science will give presentations on plasma etching, PECVD ...

FlexCoPlas - "Plasma, the 4th element" focused by industrial research ...

SENTECH achieved results within the project work in two areas: First, an optical broadband monitoring with adaptive strategy based on the in situ transmission measurements was developed. This is based on adaptive strategies during deposition to de ...

SENTECH at SEMICON CHINA 2017 & SNEC Show 2017 ...

In April 2017 two of the major exhibition highlights for SENTECH took place in China. As we are experts in leading edge plasma process technology equipment for etching and deposition, as well as thin film measurement instrumentation, the SEMICON Chin ...

Alle Meldungen von SENTECH Instruments GmbH